Precision Making Sensors

High-resolution reflectometer for optical market takes efficiency to new levels

by Yokogawa Test&Measurement January 15, 2025

Do you need to perform the internal structure analysis of optical modules or the visualization of microcracks in optical connectors? If so, you’ve probably been struggling to find a high-resolution reflectometer that’s both highly efficient and very accurate. Here at Yokogawa Test & Measurement Corporation, we’re ahead of the game with our track record of developing timely solutions to the latest market demands. In this case, the result is our new AQ7420 reflectometer.

In the optical market, existing solutions were falling short of requirements. Thanks to our close customer relationships, we became aware of demands for less spurious noise to avoid false effects in measurements and the potential to perform certain measurements simultaneously. Further desirables included faster measurement times and enhanced stability of measured waveforms. We set about developing the optimal solution.

Taking advantage of OLCR (optical low-coherence reflectometry) technology, our new AQ7420 reflectometer provides a spatial resolution of 40 µm and back reflection measurement sensitivity down to -100 dB or lower. In combination with the optional sensor head unit, you can measure insertion loss and back reflection simultaneously, supporting both efficient and cost-effective optical inspection.

If you’re a researcher of silicon photonics, a manufacturer of optical connectors, or involved in the internal structure analysis of optical components, you’ll definitely benefit from our AQ7420 high-resolution reflectometer.

Maybe you currently use conventional OLCR/OFDR technology-based devices? If so, spurious (ghost) noise is often observable in areas where there’s no actual reflection. We know (because you tell us) that it leads to misjudgments, which sometime prove costly. As a consequence, you probably have to rely on highly specialist knowledge to ensure your waveform analysis is correct.

There’s no such need with our AQ7420, which reduces spurious noise to a competitive -100 dB. The result? The elimination of ghost effects and simplification of waveform analysis.

As a further challenge, OLCR/OFDR instruments are often unable to check the amount of back reflection accurately due to poor measurement precision in the vertical axis (amount of reflection level). Our AQ7420 high-resolution reflectometer overcomes this challenge by enabling measurement with an uncertainty of ±3 dB. With the optical sensor head, you can measure insertion loss simultaneously with an uncertainty of ±0.02 dB.

Notably, our AQ7420 features intuitive control software with Windows 11 compatibility. The control software provides you with key information on the optical return loss distribution waveform, reflection point location, optical reflection loss, and judgement waveform scaling. It also offers a useful marker function.

Two models of our new high-resolution reflectometer are available. The base model is the AQ7420-13NN which, with its wavelength of 1310 nm, is sufficient for the rapid micro-crack inspection of connectors. Compared with our previous-generation product (AQ7410), the measurement time is 50% quicker, approximately 6 seconds compared with 12 seconds before.

However, if you’re seeking even more capability and efficiency in your testing operations, we also offer the AQ7420-1315, which allows you to take advantage of two wavelengths in a single unit: 1310 nm and 1550 nm. This model is suitable for simultaneous back-reflection and Insertion loss measurements without any need for other instruments, further shortening the time required for optical connector inspection.

If you want to introduce a step change into your optical market applications, come and take a look at our AQ7420 high-resolution reflectometer. After all, seeing is believing.

For further information on the AQ7420, click here.

This material maybe not be reproduced without express permission from Yokogawa, please contact: PrecisionMaking.EU@yokogawa.com